کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
545873 | 1450556 | 2008 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Signal probability for reliability evaluation of logic circuits
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
As integrated circuits scale down into nanometer dimensions, a great reduction on the reliability of combinational blocks is expected. This way, the susceptibility of circuits to intermittent and transient faults is becoming a key parameter in the evaluation of logic circuits, and fast and accurate ways of reliability analysis must be developed. This paper presents a reliability analysis methodology based on signal probability, which is of straightforward application and can be easily integrated in the design flow. The proposed methodology computes circuit’s signal reliability as a function of its logical masking capabilities, concerning multiple simultaneous faults occurrence.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1586–1591
Journal: Microelectronics Reliability - Volume 48, Issues 8–9, August–September 2008, Pages 1586–1591
نویسندگان
Denis Teixeira Franco, Maí Correia Vasconcelos, Lirida Naviner, Jean-François Naviner,