کد مقاله کد نشریه سال انتشار مقاله انگلیسی ترجمه فارسی نسخه تمام متن
5462558 1517177 2018 4 صفحه PDF سفارش دهید دانلود کنید
عنوان انگلیسی مقاله ISI
A simple route to deposit SiO2 film with resistivity >109 Ω·μm
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
A simple route to deposit SiO2 film with resistivity >109 Ω·μm
چکیده انگلیسی
Amorphous SiO2 film was deposited by the direct current pulsed magnetron sputtering technology, which the reciprocating motion was carried out onto the substrate. Without reciprocating motion, the resistivity of SiO2 film was only about 3.3 × 106 Ω·μm. With 500 circles reciprocating motion, the resistivity increased to 1.9 × 109 Ω·μm. Transmission electron microscopy results revealed that the straight line structure with lower local atomic density passed over SiO2 film, which deteriorated the resistivity seriously. The reciprocating motion of substrate could destroy above straight line structure to pass over SiO2 film, which kept SiO2 film with resistivity at 109 Ω·μm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 211, 15 January 2018, Pages 277-280
نویسندگان
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