کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5462616 | 1517178 | 2018 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
{1Â 0Â â1Â 2} twin nucleation induced by FIB micro-stress in magnesium single crystal
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In this study, Mg single crystals (99.99% purity) were subjected to focused ion beam (FIB) bombardment perpendicular and parallel to the c-axis of the hexagonal close packed (HCP) lattice respectively. The research results indicate that the {1Â 0Â â1Â 2} twin nucleation induced by FIB micro-stress in magnesium single crystal is dependent on the applied ion current and the crystal orientation. The incident Ga+ ions dose increases with ion current, which would enhance the FIB loading micro-stress. And when the FIB incident direction is parallel to the close-packed (0Â 0Â 0Â 1) plane, there would be more ion-atom interactions during FIB bombardment. Both processing mechanisms could lead to larger precipitate-matrix misfit area and further microstructure damage, which might eventually facilitate {1Â 0Â â1Â 2} twin nucleation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 210, 1 January 2018, Pages 139-142
Journal: Materials Letters - Volume 210, 1 January 2018, Pages 139-142
نویسندگان
Chao Lou, Jiangping Yu, Li Liu, Yi Ren, Xiyan Zhang,