کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5462616 1517178 2018 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
{1 0 −1 2} twin nucleation induced by FIB micro-stress in magnesium single crystal
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
{1 0 −1 2} twin nucleation induced by FIB micro-stress in magnesium single crystal
چکیده انگلیسی
In this study, Mg single crystals (99.99% purity) were subjected to focused ion beam (FIB) bombardment perpendicular and parallel to the c-axis of the hexagonal close packed (HCP) lattice respectively. The research results indicate that the {1 0 −1 2} twin nucleation induced by FIB micro-stress in magnesium single crystal is dependent on the applied ion current and the crystal orientation. The incident Ga+ ions dose increases with ion current, which would enhance the FIB loading micro-stress. And when the FIB incident direction is parallel to the close-packed (0 0 0 1) plane, there would be more ion-atom interactions during FIB bombardment. Both processing mechanisms could lead to larger precipitate-matrix misfit area and further microstructure damage, which might eventually facilitate {1 0 −1 2} twin nucleation.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 210, 1 January 2018, Pages 139-142
نویسندگان
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