کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
548248 872186 2012 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Novel Fe-containing Sn–1Ag–0.5Cu lead-free solder alloy with further enhanced elastic compliance and plastic energy dissipation ability for mobile products
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Novel Fe-containing Sn–1Ag–0.5Cu lead-free solder alloy with further enhanced elastic compliance and plastic energy dissipation ability for mobile products
چکیده انگلیسی

This work investigates the effects of small additions (0.1 and 0.3 wt.%) of Fe on the microstructure, mechanical, and thermal properties of the Sn–1Ag–0.5Cu (SAC105) solder alloy. The addition of Fe leads to the formation of large FeSn2 intermetallic compound (IMC) particles located in the eutectic regions besides the small Ag3Sn and Cu6Sn5 IMC particles. Fe-bearing solders have also been shown to form large primary β-Sn grains. The formation of large FeSn2 IMC particles, together with the presence of large primary β-Sn grains have resulted in a significant reduction on the elastic modulus and yield strength. Moreover, the presence of large primary β-Sn grains causes the Fe-bearing solders to maintain the total elongation at the SAC105 level. This effect can increase the elastic compliance and plastic energy dissipation ability of the bulk solder, which play an important role in drop impact performance enhancement. The addition of Fe did not produce any significant effect on the melting behavior. As a result, the use conditions of the Fe-bearing solders are consistent with the conditions for conventional Sn–Ag–Cu solder alloys.


► This work investigates the effect of Fe addition on the SAC105 bulk solder.
► The addition of Fe leads to the formation of large FeSn2 IMC particles.
► The addition of Fe also leads to the formation of large primary β-Sn grains.
► This effect leads to significantly reduce the elastic modulus and yield strength.
► The presence of large β-Sn grains maintains the total elongation at the SAC105 level.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 52, Issue 11, November 2012, Pages 2701–2708
نویسندگان
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