Characterisation method for chip card ESD events causing terminal failures

► Some dual-interface chip cards can cause a system crash of card reader terminals. ► The terminal failures could be reproduced in the lab by inserting charged cards. ► Card discharge pulses were measured with sub-nanosecond temporal resolution. ► The total pulse charge as function of peak voltage can distinguish the card types. ► The extracted equivalent circuit could be a basis for a charged card model (CCM).