Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionization time-of-flight mass spectrometry

Wafer-level detection of organic contamination by ZnO-rGO hybrid-assisted laser desorption/ionization time-of-flight mass spectrometry

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Talanta - Volume 182, 15 May 2018, Pages 273-278

Kookjoo Kim, Kiju Um, Cheolsang Yoon, Won Sun Ryoo, Kangtaek Lee,