کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8032926 1517963 2018 28 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Influence of film thickness on the structural transition cubic/hexagonal within Ti0.38Al0.62N films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Influence of film thickness on the structural transition cubic/hexagonal within Ti0.38Al0.62N films
چکیده انگلیسی
Metastable Ti1−xAlxN films have the more outstanding functional properties in the range of composition around x = 0.6 for their use as protective coatings. They exhibit complex texture because of the phase transition between TiN-like rocksalt and AlN-like wurtzite structures. The competitive growth between cubic and wurtzite domains is studied in metastable Ti0.38Al0.62N thin film deposited by reactive magnetron sputtering for thicknesses between 1 and 3.7 μm. Long-range order is analysed within the film by X-ray diffraction and cross-sectional TEM imaging. The study is complemented by using Ti K-edge diffraction anomalous spectroscopy to obtain differentiated information on short-range order around Ti atoms incorporated in cubic and wurtzite domains. The growth along the [111]c direction has the effect of promoting the appearance of crystallites with wurtzite symmetry oriented along [001]h. In the middle of the layer, cubic and wurtzite domains become coherently oriented. Lattice distortions, which affect long- and short-range order, are revealed by the anisotropy of broadening of the diffraction lines and by spectroscopic data collected on the main diffraction lines. The fine pre-edge structure indicates a strong distortion of the tetrahedral sites occupied by Ti atoms along the c axis, which minimizes the in-plane lattice mismatch. Near the film surface, a dramatic change in growth directions is observed. A better understanding of the structural transition mechanism in the (Ti,Al)N system could help improve the mechanical performances of these coatings in the future.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 649, 1 March 2018, Pages 160-166
نویسندگان
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