Considerations on accelerator systems requirements and limitations for μ-probe applications

At HVE, we investigated the influence of the small angle scattering on the beam brightness. Various ion optical approaches were compared and it was concluded that a multicusp ion source provides the possibility to minimise the degradation in the beam brightness due to small angle scattering of the ions. It is expected that a beam brightness of 10-50 A m−2 rad−2 eV−1 can be achieved with the Tandetron™ accelerator systems.