Keywords: Angular-resolved X-ray induced photoelectron spectroscopy; ARXPS; C 1s; C KVV; Parameter D; C sp2/C sp3; Argon gas cluster ion beam; ArGCIB; Maximum entropy method; MEM; Depth profile reconstruction;
مقالات ISI (ترجمه نشده)
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Keywords: TaN; TiN; Interface; LiNbO3; ARXPS; Stability; SAW;
Surface oxidation of SnTe topological crystalline insulator
Keywords: Topological crystalline insulator; Oxidation process; ToF-SIMS; ARXPS; Raman spectroscopy; Depth profiling;
Atomic configurations in AP-MOVPE grown lattice-mismatched InGaAsN films unravelled by X-ray photoelectron spectroscopy combined with bulk and surface characterization techniques
Keywords: III-V semiconductors; Dilute nitrides; N-bonding configuration; N-related defects; (AP)-MOVPE; ARXPS;
Low energy ion scattering as a depth profiling tool for thin layers - Case of bromine methanol etched CdTe
Keywords: CdTe; Bromine methanol etching; Thin films; Depth profile; Stoichiometry; Surface analysis; ARXPS; Dynamic LEIS;
Sub-nanometer resolution XPS depth profiling: Sensing of atoms
Keywords: XPS; ARXPS; Maximum Entropy Method; Sub-nanometer resolution; Nano films;
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies
Keywords: IIIâ¿¿V semiconductors; GaInP; AlInP; ARXPS; Depth profiling; Interfaces;
Aspects of native oxides etching on n-GaSb(1Â 0Â 0) surface
Keywords: GaSb; Native oxides; Sputtering; Etching; Annealing; ARXPS;
Quantification of deexcitation processes for analyzing liquid surfaces
Keywords: NICISS; ARXPS; MIES; Micelle formation; Bimodal free energy distribution of molecules;
PTFE surface modification by Ar plasma and its characterization
Keywords: Polytetrafluoroethylene; Plasma; Contact angle; Zeta potential; AFM; ARXPS
Resolving overlapping peaks in ARXPS data: The effect of noise and fitting method
Keywords: Peak fitting; Sequential fitting; Simultaneous fitting; Effect of noise; Overlapping peaks; XPS; ARXPS;
An XPS and ellipsometry study of Cr–O–Al mixed oxides grown by reactive magnetron sputtering
Keywords: Cr–O–Al mixed oxides; Reactive sputtering; ARXPS; Preferential sputtering
Effect of flame treatment on formulated polyvinylchloride surface: A study using ARXPS
Keywords: ARXPS; PVC; Flame treatment; Segregation;
XPS and angle resolved XPS, in the semiconductor industry: Characterization and metrology control of ultra-thin films
Keywords: XPS; ARXPS; Semiconductor wafer; Metrology; Materials characterization;
An ARXPS primer
Keywords: ARXPS; Laplace transform; Tikhonov regularization; Maximum entropy;
A variable density model for the interpretation of ARXPS data
Keywords: ARXPS; Tikhonov regularization; Regularization parameter; Plasma oxidized polystyrene; Variable density model;
On the choice of the regularization parameter for the interpretation of ARXPS data using a multilayer model
Keywords: ARXPS; Tikhonov regularization; Regularization parameter; Plasma-oxidized polystyrene;
Parallel angle resolved XPS investigations on 12 in. wafers for the study of W and WSix oxidation in air
Keywords: XPS; ARXPS; Tungsten; Tungsten silicide; 12 in. Wafers; Oxidation mechanisms; Depth profile; ToF SIMS; Thickness measurement
Surface-modification and characterization of H-titanate nanotube
Keywords: H-titanate nanotubes; Surface-modified; ARXPS
Resolving the depth coordinate in photoelectron spectroscopy - Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system
Keywords: XPS; Depth resolution; Synchrotron XPS; Excitation energy; ARXPS; Self-assembled monolayers;
Angle resolved X-ray photoemission spectroscopy double layer model for in situ characterization of metal organic chemical vapour deposition nanometric films
Keywords: ARXPS; Thickness measurement; Interface; Thin film; MOCVD; TiO2;
XPS and ARXPS investigations of ultra thin TaN films deposited on SiO2 and Si
Keywords: 33.60.Fy; 79.60.Jv; 81.15.Cd; XPS; ARXPS; Tantalum nitride; Diffusion barrier; Silicon; Silicon oxide;