Keywords: پرتو یون خوشه ای; GCIB; Cluster ion beam; Mass filter; Rotating electric field; Secondary ion mass spectroscopy;
مقالات ISI پرتو یون خوشه ای (ترجمه نشده)
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Keywords: پرتو یون خوشه ای; Cluster ion beam; Gas cluster ion beam (GCIB); MD simulation; Low energy implantation; Lateral sputtering; Surface modification; Surface smoothing; Bio-materials; Analytical instrumentation;
Keywords: پرتو یون خوشه ای; Cluster; Condensation; Cluster ion beam; Mass spectrometry; Free jet; Simulation;
Keywords: پرتو یون خوشه ای; Cluster ion beam; Industrial applications; Low energy interaction; Lateral sputtering; Nanotechnology;
Keywords: پرتو یون خوشه ای; Water; Cluster ion beam; Silicon;
A new technique to detect antibody-antigen reaction (biological interactions) on a localized surface plasmon resonance (LSPR) based nano ripple gold chip
Keywords: پرتو یون خوشه ای; Localized surface plasmon resonance; Cluster ion beam; Nano ripple array; Antibody antigen reaction;
Study on the coloration response of a radiochromic film to MeV cluster ion beams
Keywords: پرتو یون خوشه ای; Cluster ion beam; C60 fullerene ion; Radiochromic film; Beam profile; Electrostatic accelerator;
Gold nano-ripple structure with potential for bio molecular sensing applications
Keywords: پرتو یون خوشه ای; Localized surface plasmon resonance; Cluster ion beam; Bio sensing; Plasmonic applications; Nano-ripple array;
Irradiation effects of water cluster ion beam on PMMA surface
Keywords: پرتو یون خوشه ای; Cluster ion beam; Water; PMMA; Sputtering;
Conductive tracks of 30-MeV C60 clusters in doped and undoped tetrahedral amorphous carbon
Keywords: پرتو یون خوشه ای; Conducting ion tracks; Tetrahedral amorphous carbon; Cluster ion beam;
Molecular migration behaviors in organic light-emitting diodes with different host structures
Keywords: پرتو یون خوشه ای; Organic light-emitting diode; Degradation; Molecular migration; Cluster ion beam; X-ray photoelectron spectrometry (XPS)
Low-temperature formation of silicon dioxide films by oxygen cluster ion beam assisted deposition
Keywords: پرتو یون خوشه ای; Cluster ion beam; Silicon dioxide; Low-temperature deposition
Molecular dynamics simulations for gas cluster ion beam processes
Keywords: پرتو یون خوشه ای; Cluster ion beam; Molecular dynamics simulation; Crater formation; Surface modification
Irradiation effects on solid surfaces by water cluster ion beams
Keywords: پرتو یون خوشه ای; 36.40.âc; 68.49.Sf; 68.55.Ln; Cluster ion beam; Sputtering; Oxidation; Surface modification;
Size distribution measurement and separation of ethanol cluster ion beams
Keywords: پرتو یون خوشه ای; 36.40.âc; 07.75.+h; Cluster ion beam; Cluster size distribution;
Effect of ion species on apatite-forming ability of silicone elastomer substrates irradiated by cluster ion beams
Keywords: پرتو یون خوشه ای; Cluster ion beam; Apatite; Silicone; Simulated body fluid
MD simulation study of the sputtering process by high-energy gas cluster impact
Keywords: پرتو یون خوشه ای; MD simulation; Cluster ion beam; Sputtering models;
Photocatalytic properties of Cr-doped TiO2 films prepared by oxygen cluster ion beam assisted deposition
Keywords: پرتو یون خوشه ای; TiO2; Anatase; Rutile; Cluster ion beam; Photocatalytic property; Contact angle; AFM
Depth profiling of taxol-loaded poly(styrene-b-isobutylene-b-styrene) using Ga+ and C60+ ion beams
Keywords: پرتو یون خوشه ای; TOF-SIMS; AFM; Cluster ion beam; Profiles; Stents;
Production of liquid cluster ions and their application to surface etching
Keywords: پرتو یون خوشه ای; 36.40.Wa; 41.85.−p; 81.65.CfEthanol cluster; Cluster ion beam; Cluster size; Surface etching; Sputtering yield
Photocatalytic properties of TiO2 films prepared by O2 cluster ion beam assisted deposition method
Keywords: پرتو یون خوشه ای; 36.40.Wa; 81.15.Jj; 82.50.Nd; 82.80.Rt; TiO2; Anatase; Rutile; Cluster ion beam; Photocatalytic property;
Interactions of argon cluster ion beams with silicon surfaces
Keywords: پرتو یون خوشه ای; 36.40.Wa; 82.80.Yc; 83.10.Rs; Cluster ion beam; Silicon surface; Rutherford backscattering spectrometry; Molecular dynamic simulation; Irradiation damage;
MD simulation of surface smoothing due to cluster impact: estimation of radiation damage
Keywords: پرتو یون خوشه ای; 61.72.Cc; 61.80.âx; 68.35.Bs; 79.20.Ap; 79.20.Rf; Molecular dynamics simulation; Cluster ion beam; Surface smoothing; Radiation damage; Defect formation;