Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers
Keywords: سیمز استاتیک; PEI; polyethylene imine; PI; primary ion; PS; polystyrene; SI; secondary ion; SIY; secondary ion yield; SpN; sputtering number; Static SIMS; Cluster bombardment; Fragmentation; Non-linear yield enhancement; Near-surface energy deposition; Stopping power;