کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10672461 | 1009859 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate Atom probe tomography of a Ti-Si-Al-C-N coating grown on a cemented carbide substrate](/preview/png/10672461.png)
چکیده انگلیسی
The elemental distribution within a Ti-Si-Al-C-N coating grown by physical vapour deposition on a Cr-doped WC-Co cemented carbide substrate has been investigated by atom probe tomography. Special attention was paid to the coating/substrate interface region. The results indicated a diffusion of substrate binder phase elements into the Ti-N adhesion layer. The composition of this layer, and the Ti-Al-N interlayer present between the adhesion layer and the main Ti-Si-Al-C-N layer, appeared to be sub-stoichiometric. The analysis of the interlayer showed the presence of internal surfaces, possibly grain boundaries, depleted in Al. The composition of the main Ti-Al-Si-C-N layer varied periodically in the growth direction; layers enriched in Ti appeared with a periodicity of around 30Â nm. Laser pulsing resulted in a good mass resolution that made it possible to distinguish between N+ and Si2+ at 14Â Da.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 159, Part 2, December 2015, Pages 308-313
Journal: Ultramicroscopy - Volume 159, Part 2, December 2015, Pages 308-313
نویسندگان
M. Thuvander, G. Ãstberg, M. Ahlgren, L.K.L. Falk,