کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1589884 1002012 2007 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A history of scanning electron microscopy developments: Towards “wet-STEM” imaging
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
A history of scanning electron microscopy developments: Towards “wet-STEM” imaging
چکیده انگلیسی

A recently developed imaging mode called “wet-STEM” and new developments in environmental scanning electron microscopy (ESEM) allows the observation of nano-objects suspended in a liquid phase, with a few manometers resolution and a good signal to noise ratio. The idea behind this technique is simply to perform STEM-in-SEM, that is SEM in transmission mode, in an environmental SEM.The purpose of the present contribution is to highlight the main advances that contributed to development of the wet-STEM technique. Although simple in principle, the wet-STEM imaging mode would have been limited before high brightness electron sources became available, and needed some progresses and improvements in ESEM. This new technique extends the scope of SEM as a high-resolution microscope, relatively cheap and widely available imaging tool, for a wider variety of samples.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 38, Issue 4, June 2007, Pages 390–401
نویسندگان
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