کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1665294 1518039 2014 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
X-ray scattering of calcite thin films deposited by atomic layer deposition: Studies in air and in calcite saturated water solution
ترجمه فارسی عنوان
پراکندگی اشعه ایکس فیلم های نازک کلسیت که از طریق رسوب لایه اتمی پوشیده شده است: مطالعات در هوا و محلول آب اشباع کلسیت
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Carbonates are one of the most abundant groups of minerals in earth systems and are important in many geological settings and industrial processes. Calcite (CaCO3) thin films produced by atomic layer deposition offer a method to evaluate the surficial properties of carbonates as well as interactions at the carbonate-fluid interface. Using synchrotron X-ray reflectivity and X-ray diffraction, these films are observed to be porous, polycrystalline, and have crystallites oriented with the major (104) calcite cleavage plane parallel to the surface of the z-cut single crystal quartz substrate. An Al2O3 buffer layer, present between quartz and the calcite film, does not affect the as-deposited film, but does influence how the films reorganize in contact with fluid. Without a buffer layer, calcite reorients its crystallites to have populations of (006) and (030) parallel to the substrate, while those with an Al2O3 buffer layer become more amorphous. Amorphous films may represent an analog to amorphous calcium carbonate and provide insights into that material's thermophysical behavior. Due to a higher percentage of pore spaces available for fluid infiltration, films deposited at higher temperature make the calcite thin films more susceptible to amorphization. These films are chemically similar, but structurally dissimilar to bulk natural calcite. Nevertheless, they can be a complementary system to traditional single crystal X-ray surface scattering studies on carbonates, particularly for important but less common minerals, to evaluate mineral-fluid interfacial interactions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 565, 28 August 2014, Pages 277-284
نویسندگان
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