Current status and future directions for in situ transmission electron microscopy

• Evaluation of currently available technology for performing in situ experiments using transmission electron microscope.
• Limitations of currently available instrumentation with respect to base TEM, specialty TEM holders, and data acquisition systems.
• Guidelines and wish list for the areas of future development.

This review article discusses the current and future possibilities for the application of in situ transmission electron microscopy to reveal synthesis pathways and functional mechanisms in complex and nanoscale materials. The findings of a group of scientists, representing academia, government labs and private sector entities (predominantly commercial vendors) during a workshop, held at the Center for Nanoscale Science and Technology- National Institute of Science and Technology (CNST-NIST), are discussed. We provide a comprehensive review of the scientific needs and future instrument and technique developments required to meet them.