کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1678253 1009936 2009 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Exploration of the ultimate patterning potential achievable with focused ion beams
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Exploration of the ultimate patterning potential achievable with focused ion beams
چکیده انگلیسی

Decisive advances in the field of nanosciences and nanotechnologies are intimately related to the development of new instruments and of related writing schemes and methodologies. Therefore we have recently proposed the exploitation of the nano-structuring potential of a highly focused ion beam (FIB) as a tool, to overcome intrinsic limitations of current nano-fabrication techniques and to allow innovative patterning schemes that are urgently needed in many nanoscience challenges. In this work, we will first detail a very high-resolution FIB instrument we have developed specifically to meet these nano-fabrication requirements. Then we will introduce and illustrate an advanced FIB processing scheme that is the fabrication of artificial nanopores.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 109, Issue 5, April 2009, Pages 457–462
نویسندگان
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