کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4739954 1641135 2015 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Theoretical relationship between elastic wave velocity and electrical resistivity
ترجمه فارسی عنوان
رابطه تئوری سرعت الاستیک و مقاومت الکتریکی
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه علوم زمین و سیارات فیزیک زمین (ژئو فیزیک)
چکیده انگلیسی


• Elastic wave velocity and electrical resistivity are used.
• Gassman and Archie equations are correlated.
• The correlation is related to porosity.
• Values of bulk moduli of grains are suggested.

Elastic wave velocity and electrical resistivity have been commonly applied to estimate stratum structures and obtain subsurface soil design parameters. Both elastic wave velocity and electrical resistivity are related to the void ratio; the objective of this study is therefore to suggest a theoretical relationship between the two physical parameters. Gassmann theory and Archie's equation are applied to propose a new theoretical equation, which relates the compressional wave velocity to shear wave velocity and electrical resistivity. The piezo disk element (PDE) and bender element (BE) are used to measure the compressional and shear wave velocities, respectively. In addition, the electrical resistivity is obtained by using the electrical resistivity probe (ERP). The elastic wave velocity and electrical resistivity are recorded in several types of soils including sand, silty sand, silty clay, silt, and clay–sand mixture. The appropriate input parameters are determined based on the error norm in order to increase the reliability of the proposed relationship. The predicted compressional wave velocities from the shear wave velocity and electrical resistivity are similar to the measured compressional velocities. This study demonstrates that the new theoretical relationship may be effectively used to predict the unknown geophysical property from the measured values.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Applied Geophysics - Volume 116, May 2015, Pages 51–61
نویسندگان
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