کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5006103 | 1461386 | 2017 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Physical, structural and topographical aspects of Zn1âxCoxSe thin films
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موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In the present study, Zn1âxCoxSe (0â¤xâ¤0.275) thin films were synthesized via a chemical route and characterized through the physical, compositional, structural and morphological properties. The change in colour appearance from ash-grey to charcoal-black suggested integration of Co2+ into ZnSe host lattice. Similar conclusions on the colour appearance were drawn from colorimetric studies. The hydrophobic nature of the as-obtained sample surface was revealed in wettability measurements. Zn2+, Co2+ and Se2- states of constituents in the thin films were found in the elemental analysis. Formation of ternary alloy was confirmed by shift in (111) X-ray diffraction peak. The surface topography was analysed by an atomic force microscopy (AFM). A variety of AFM parameters were determined to study the effect of Co2+ addition onto the surface topography. Magnetic mapping of the surface topography concluded the existence of magnetic domains of irregular sizes and shapes.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 61, April 2017, Pages 71-78
Journal: Materials Science in Semiconductor Processing - Volume 61, April 2017, Pages 71-78
نویسندگان
S.T. Pawar, G.T. Chavan, V.M. Prakshale, A. Sikora, S.M. Pawar, S.S. Kamble, N.N. Maldar, L.P. Deshmukh,