In situ characterization of charge rate dependent stress and structure changes in V2O5 cathode prepared by atomic layer deposition

In situ characterization of charge rate dependent stress and structure changes in V2O5 cathode prepared by atomic layer deposition

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Power Sources - Volume 340, 1 February 2017, Pages 89-97

Hyun Jung, Konstantinos Gerasopoulos, A. Alec Talin, Reza Ghodssi,