Polycrystalline La1-xSrxMnO3 films on silicon: Influence of post-Deposition annealing on structural, (Magneto-)Optical, and (Magneto-)Electrical properties

Polycrystalline La1-xSrxMnO3 films on silicon: Influence of post-Deposition annealing on structural, (Magneto-)Optical, and (Magneto-)Electrical properties

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 427, Part A, 1 January 2018, Pages 533-540

Patrick Thoma, Manuel Monecke, Oana-Maria Buja, Dmytro Solonenko, Roxana Dudric, Oana-Tereza Ciubotariu, Manfred Albrecht, Iosif G. Deac, Romulus Tetean, Dietrich R.T. Zahn, Georgeta Salvan,