Organic adlayer on inorganic materials: XPS analysis selectivity to cope with adventitious contamination

Organic adlayer on inorganic materials: XPS analysis selectivity to cope with adventitious contamination

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 383, 15 October 2016, Pages 71-83

Jessem Landoulsi, Michel J. Genet, Sandrine Fleith, Yetioman Touré, Irma Liascukiene, Christophe Méthivier, Paul G. Rouxhet,