In situ observation of low temperature growth of Ge on Si(1 1 1) by reflection high energy electron diffraction

In situ observation of low temperature growth of Ge on Si(1 1 1) by reflection high energy electron diffraction

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 370, 1 May 2016, Pages 40-48

Andreas Grimm, Andreas Fissel, Eberhard Bugiel, Tobias F. Wietler,