Molar concentration-depth profiles at the solution surface of a cationic surfactant reconstructed with angle resolved X-ray photoelectron spectroscopy

▶ By a refined calculation procedure and with the evaluated partial molar volumes of the surfactant and the solvent, the molar concentration-depth profiles of surfactant ions have been reconstructed by angle resolved photoelectron spectroscopy. ▶ The anionic molar concentration-depth profiles and surface excesses have good agreements with their counterparts determined by neutral impact ion scattering spectroscopy.