کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5370443 | 1388494 | 2006 | 10 صفحه PDF | دانلود رایگان |
The most commonly used quantity to characterize surface cleanliness through X-ray photoemission spectroscopy (XPS) measurements is the so-called relative atomic surface concentration of carbon (at.%Â C). We have investigated the relationship between at.%Â C values and the C 1s peak area on Cu and we find a nearly linear behaviour in the range 15-80Â at.%Â C. Correction factors for the measured at.%Â C values that enable a comparison of the cleanliness level of different materials, notably Cu, Al and stainless steel, have been determined experimentally.The influence of the storage time and method on the degree of re-contamination of initially clean Cu has been examined. The carbon contamination on clean metallic Cu increases abruptly to some 20Â at.%Â C upon air exposure and continues to increase with storage time in air. Storage in polymer bags can lead to up to 70Â at.%Â C after 1 month, whereas storage in aluminium foil can preserve an acceptable surface cleanliness for a similar storage time.
Journal: Applied Surface Science - Volume 252, Issue 12, 15 April 2006, Pages 4279-4288