کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5422028 | 1507899 | 2014 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Measurement of microscopic coupling constants between atoms on a surface: Combination of LEEM observation with lattice model analysis
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We present a method combining low-energy electron microscopy (LEEM) and lattice model analysis for measuring the microscopic lateral coupling constants between atoms on a surface. The calculated step (interface) stiffness in a honeycomb lattice Ising model with the nearest neighbor and the second nearest neighbor interactions (J1Â =Â 93.8Â meV and J2Â =Â 9.38Â meV) matched the experimental step quantity values on an Si(111)(1Â ÃÂ 1) surface reported by Pang et al. and Bartelt et al. based on LEEM measurements. The experimental value of step tension obtained by Williams et al. lies on the calculated step tension curve. The polar graphs of the step tension and a two-dimensional island shape at the temperature TÂ =Â 1163Â K also agree well with the experimental graphs reported by Métois and Müller. The close agreement between the LEEM observations and the lattice model calculations on a Si(111) surface suggests that our method is also suitable for measuring microscopic lateral coupling constants on the surface of other materials that are less well-studied than Si.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 630, December 2014, Pages 109-115
Journal: Surface Science - Volume 630, December 2014, Pages 109-115
نویسندگان
Noriko Akutsu,