کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5466724 1518299 2017 30 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Twenty years after: How “Aberration correction in the STEM” truly placed a “A synchrotron in a Microscope”
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Twenty years after: How “Aberration correction in the STEM” truly placed a “A synchrotron in a Microscope”
چکیده انگلیسی
Nearly two decades have passed since the Electron Microscopy and Analysis Group (EMAG) Conference was held in Cambridge in 1997, during which two seminal lectures were delivered that would influence the future of the U.K. electron microscopy community. With “Aberration correction in the STEM”, O.L. Krivanek and co-workers ushered in the era of probe-corrected scanning transmission electron microscopy, a powerful technology that L.M. Brown urged the community at large to embrace, arguing that it would be akin to placing “A Synchrotron in a Microscope”. This contribution will provide a personal account of how three generations of instruments installed at the SuperSTEM Laboratory, the national facility established after L.M. Brown's vision, have made these powerful statements come true.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 180, September 2017, Pages 41-51
نویسندگان
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