کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5466736 | 1518299 | 2017 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Single-atom detection of light elements: Imaging or spectroscopy?
ترجمه فارسی عنوان
تشخیص تک عنصر عناصر سبک: تصویربرداری یا اسپکتروسکوپی؟
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Single-atom imaging and spectroscopy at a lower accelerating voltage (~60Â kV) has been largely facilitated by the development of aberration correctors for transmission electron microscopy (TEM)/ scanning TEM (STEM). Such an STEM condition will reduce beam damage and has therefore been demonstrated capable of detecting individual atoms of light elements including B, C, and N in mono-layered materials. However, other light elements such as Li, O, or F are still difficult to visualise as individual atoms by using conventional STEM/TEM imaging because their extremely weak contrast can be often smeared out by the other atoms nearby. In this paper, we demonstrate the successful detection of these 'hardly visible' atoms in the spectroscopy mode.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 180, September 2017, Pages 150-155
Journal: Ultramicroscopy - Volume 180, September 2017, Pages 150-155
نویسندگان
Ryosuke Senga, Kazu Suenaga,