Reliability study of organic complementary logic inverters using constant voltage stress

We performed constant voltage stresses with different bias conditions on all-organic complementary inverters. We found a 20% maximum variation of DC inverter parameters after a 104-s stress. However, the largest stress-induced degradation was found in the delay times, which increased by a factor as high as 7. This is mainly due to the threshold voltage variation of the p-type thin-film-transistor and the mobility reduction of the n-type thin-film transistors, which both decrease the saturation drain current.