کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7986652 | 1515148 | 2015 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Maintaining the genuine structure of 2D materials and catalytic nanoparticles at atomic resolution
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The recent development of atomic resolution, low dose-rate electron microscopy allows investigating 2D materials as well as catalytic nano particles without compromising their structural integrity. For graphene and a variety of nanoparticle compositions, it is shown that a critical dose rate exists of <100Â eâ/Ã
2Â s at 80Â keV of electron acceleration that allows maintaining the genuine object structures including their surfaces and edges even if particles are only 3Â nm large or smaller. Moreover, it is demonstrated that electron beam-induced phonon excitation from outside the field of view contributes to a contrast degradation in recorded images. These degradation effects can be eliminated by delivering electrons onto the imaged area, only, by using a Nilsonian illumination scheme in combination with a suitable aperture at the electron gun/monochromator assembly.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 68, January 2015, Pages 164-175
Journal: Micron - Volume 68, January 2015, Pages 164-175
نویسندگان
H.A. Calderon, C. Kisielowski, P. Specht, B. Barton, F. Godinez-Salomon, O. Solorza-Feria,