Buckle initiation and delamination of patterned ITO layers on a polymer substrate

► Our focus is on mechanics of thin films on flexible substrates for flexible display applications. This includes synthesis of the layered structures using physical vapor deposition (PVD) applying a mechanical loading using a bending device. ► In this paper, buckle initiation and delamination of patterned ITO layers on a polymer substrate was studied. Various buckle modes have been observed depending on the type of etch defects and the crack patterns. ► The buckle density was found to be dependent on the number of etch defects, imperfections, applied uniaxial compressive strain and the loading time. ► Edge defects resulting from the specimen cutting were found to serve as a point of initiation of layer buckling. They also influence the propagating buckle from the interior of the specimen when it approaches the specimen edge.