کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8038488 1518344 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The use of a central beam stop for contrast enhancement in TEM imaging
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
The use of a central beam stop for contrast enhancement in TEM imaging
چکیده انگلیسی
Dark field TEM imaging using a stop of the central beam (DF-000) is reported. It is shown that a strong enhancement in the contrast can be obtained for graphene as example of weak phase object and endocytic multivescilar body as example of an unstained biological sample. No charging or significant contamination of the central beam stop is observed. For graphene, a resolution beyond 1 Å−1 was easily obtained. DF-000 imaging can be considered as a good and easy to use alternative of a phase plate.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 134, November 2013, Pages 200-206
نویسندگان
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