کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9789701 1512914 2005 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Thermal correction to resistivity in dilute 2D Si-based systems
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Thermal correction to resistivity in dilute 2D Si-based systems
چکیده انگلیسی
Neglecting e-e interactions and quantum interference effects, we calculate the classical resistivity of 2D electron (hole) gas, taking into account the degeneracy and the thermal correction due to the combined Peltier and Seebeck effects. The resistivity is found to be universal function of temperature, expressed in units of h/e2(kFl)-1. Analysis of compressibility and thermopower points to thermodynamic nature of metal-insulator transition in 2D systems. We reproduce the beating pattern of Shubnikov-de Haas oscillations in both the crossed field configuration and Si-MOSFET valley splitting cases. The consequences of IQHE in dilute Si-MOSFET 2DEG is discussed. The giant parallel magnetoresistivity is argued to result from the magnetic field-driven disorder.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica E: Low-dimensional Systems and Nanostructures - Volume 27, Issues 1–2, March 2005, Pages 151-162
نویسندگان
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