کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9834657 | 1524912 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Light-free magnetic resonance force microscopy for studies of electron spin polarized systems
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Light-free magnetic resonance force microscopy for studies of electron spin polarized systems Light-free magnetic resonance force microscopy for studies of electron spin polarized systems](/preview/png/9834657.png)
چکیده انگلیسی
Magnetic resonance force microscopy is a scanned probe technique capable of three-dimensional magnetic resonance imaging. Its excellent sensitivity opens the possibility for magnetic resonance studies of spin accumulation resulting from the injection of spin polarized currents into a para-magnetic collector. The method is based on mechanical detection of magnetic resonance which requires low noise detection of cantilever displacement; so far, this has been accomplished using optical interferometry. This is undesirable for experiments on doped silicon, where the presence of light is known to enhance spin relaxation rates. We report a non-optical displacement detection scheme based on sensitive microwave capacitive readout.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 286, February 2005, Pages 324-328
Journal: Journal of Magnetism and Magnetic Materials - Volume 286, February 2005, Pages 324-328
نویسندگان
Denis V. Pelekhov, Camelia Selcu, Palash Banerjee, Kin Chung Fong, P. Chris Hammel, Harish Bhaskaran, Keith Schwab,