کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1587989 1001773 2007 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
XRF for Film Thickness Measurement: Pros. vs. Cons of Common Configurations
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
XRF for Film Thickness Measurement: Pros. vs. Cons of Common Configurations
چکیده انگلیسی

SummaryWhile the portability of the hand-held XRF tool provides a very real and attractive level of additional capability in terms of measurement location and sample types that can be measured, care must be taken to assure that sample size and measurement location size are adequately satisfied by the handheld tool. In addition, thought should be given as to the methodology of individual part and multiple part measurements and how they relate to the way either a benchtop or hand-held XRF tool must be used. As is always the case, each configuration has its advantages and disadvantages. Which tool is the better choice will depend on your specific needs.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Metal Finishing - Volume 105, Issue 10, 2007, Pages 496-500