کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5454640 | 1514355 | 2017 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
High-resolution transmission electron microscopy analysis of nanograined germanium produced by high-pressure torsion
ترجمه فارسی عنوان
تجزیه و تحلیل میکروسکوپ الکترونی با وضوح بالا از نانوساختار ژرمانیم تولید شده توسط پیچشی با فشار بالا
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
چکیده انگلیسی
The nanostructure of bulk nanograined germanium (Ge) processed by high-pressure torsion (HPT) has been analyzed by high-resolution electron microscopy. Crystalline Ge disks were subjected to HPT under the nominal pressure of 24Â GPa. The samples processed at room temperature consisted of diamond-cubic Ge-I and simple-tetragonal Ge-III nanograins in addition to amorphous regions. The samples contained lattice defects such as dislocations, nanotwins, and stacking faults. Subsequent annealing at 573Â K led to the phase transformation from Ge-III to Ge-I, but residual Ge-III nanograins and lattice defects remained due to the low annealing temperature. It was found that Ge-I as well as residual Ge-III nanograins and some amorphous phase were present after processing by HPT at cryogenic temperature. No other metastable phases such as body-centered-cubic Ge-IV or hexagonal-diamond Ge-V were observed in the cryogenic HPT-processed sample.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 132, October 2017, Pages 132-138
Journal: Materials Characterization - Volume 132, October 2017, Pages 132-138
نویسندگان
Yoshifumi Ikoma, Kazuki Kumano, Kaveh Edalati, Martha R. McCartney, David J. Smith, Zenji Horita,