Cubic InGaN/GaN multi-quantum wells and AlGaN/GaN distributed Bragg reflectors for application in resonant cavity LEDs Fulltext Access 6 Pages 2005
Investigation of electromagnetic radiation induced by conducting wire of nanometer multi-quantum well device on InGaN LED Fulltext Access 6 Pages 2005
Fabrication and characterisation of high quality ZnO thin films by reactive electron beam evaporation technique Fulltext Access 6 Pages 2005
A pixel cache architecture with selective placement scheme based on z-test result Fulltext Access 6 Pages 2005
Active regenerative chatter suppression during boring manufacturing process Fulltext Access 6 Pages 2005
Comparing classification techniques for predicting essential hypertension Fulltext Access 6 Pages 2005
Modelling of Solute Aqueous Extraction from Carrots subjected to a Pulsed Electric Field Pre-treatment Fulltext Access 6 Pages 2005
Application of Grey System Theory in the Development of a Runoff Prediction Model Fulltext Access 6 Pages 2005
Mechanical Properties and Viability of Japanese Radish Cylinders immersed in Sodium Chloride Solutions Fulltext Access 6 Pages 2005
Existence of a global attractor for the plate equation with a critical exponent in an unbounded domain Fulltext Access 6 Pages 2005
Nonstandard finite-difference schemes for general two-dimensional autonomous dynamical systems Fulltext Access 6 Pages 2005
Multilevel multipole and local operators for potentials of the form râλ Fulltext Access 6 Pages 2005
An efficient model for improving performance of vibrating-wire instruments Fulltext Access 6 Pages 2005
Novel target type flowmeter based on a differential fiber Bragg grating sensor Fulltext Access 6 Pages 2005
Nanomanipulation and aggregation limitations of self-assembling structural proteins Fulltext Access 6 Pages 2005
Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology Fulltext Access 6 Pages 2005
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs Fulltext Access 6 Pages 2005
Gate stress effect on low temperature data retention characteristics of split-gate flash memories Fulltext Access 6 Pages 2005
Investigation on seal-ring rules for IC product reliability in 0.25-μm CMOS technology Fulltext Access 6 Pages 2005
Study of Area Scaling Effect on Integrated Circuit Reliability Based on Yield Models Fulltext Access 6 Pages 2005
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability Fulltext Access 6 Pages 2005
Excited states and infrared transition energies of a donor impurity in cylindrical GaAs-Ga0.6Al0.4As quantum well wires under the action of an applied magnetic field Fulltext Access 6 Pages 2005
Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs Fulltext Access 6 Pages 2005
A pipelined array architecture for Euclidean distance transformation and its FPGA implementation Fulltext Access 6 Pages 2005
Implementation of a modified Fuzzy C-Means clustering algorithm for real-time applications Fulltext Access 6 Pages 2005
Digital copy milling-autonomous milling process control without an NC program Fulltext Access 6 Pages 2005
Design of Mamdani fuzzy logic controllers with rule base minimisation using genetic algorithm Fulltext Access 6 Pages 2005
Interface microstructure effects in Au thermosonic ball bonding contacts by high reliability wire materials Fulltext Access 6 Pages 2005
Systematic coarse-graining of atomistic models for simulation of polymeric systems Fulltext Access 6 Pages 2005
Thermodynamic modelling of supercritical fluid–solid phase equilibrium data Fulltext Access 6 Pages 2005
Numerical techniques for determining heat energy targets in pinch analysis Fulltext Access 6 Pages 2005
Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions Fulltext Access 6 Pages 2005
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations Fulltext Access 6 Pages 2005
Assessment of the Analytical Capabilities of Scanning Capacitance and Scanning Spreading Resistance Microscopy Applied to Semiconductor Devices Fulltext Access 6 Pages 2005
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products Fulltext Access 6 Pages 2005
Knowledge incorporated support vector machines to detect faults in Tennessee Eastman Process Fulltext Access 6 Pages 2005
Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast Fulltext Access 6 Pages 2005
Innovative packaging technique for backside optical testing of wire-bonded chips Fulltext Access 6 Pages 2005
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout Fulltext Access 6 Pages 2005
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis Fulltext Access 6 Pages 2005
Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects Fulltext Access 6 Pages 2005
Effect of test condition and stress free temperature on the electromigration failure of Cu dual damascene submicron interconnect line-via test structures Fulltext Access 6 Pages 2005
ESD circuit model based protection network optimisation for extended-voltage NMOS drivers Fulltext Access 6 Pages 2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure Fulltext Access 6 Pages 2005
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs Fulltext Access 6 Pages 2005