Full-field measurement with nanometric accuracy of 3D superficial displacements by digital profile correlation: A powerful tool for mechanics of materials

Full-field measurement with nanometric accuracy of 3D superficial displacements by digital profile correlation: A powerful tool for mechanics of materials

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials & Design - Volume 159, 5 December 2018, Pages 170-185

Luigi Bruno,