کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10408765 893709 2005 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Defects analysis of Al/Si artificial nanocluster with moiré fringes
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
Defects analysis of Al/Si artificial nanocluster with moiré fringes
چکیده انگلیسی
In this paper, it is demonstrated the defects play a very important role in determining the quality of artificial nanoclusters grown. The surface strain (stress) distribution around defects in Al artificial nanocluster is analyzed by Moiré fringes pattern. The moiré fringes generated by scanning lines in monitor and nanocluster array can be used as a “magnifier” to study surface imperfections with scanning tunneling microscopy (STM). As moiré fringes' exist in many ordered nanostructures and adsorbate systems, the method is expected to have wide applications.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 43, Issue 10, October 2005, Pages 1071-1080
نویسندگان
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