کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10408837 | 893733 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Profile measurement of a one-dimensional phase boundary sample using a single shot phase-step method
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Profile measurement of a one-dimensional phase boundary sample using a single shot phase-step method Profile measurement of a one-dimensional phase boundary sample using a single shot phase-step method](/preview/png/10408837.png)
چکیده انگلیسی
Phase shifting interferometry is a preferred technique for high-resolution phase profile measurement, but the difficulty in generating the requested shifted pattern has limited the use of the technique to low-noise environment and in case accurate calibration of the phase shifting device is available. In the present experiment, a sample having one-dimensional straight phase boundary is mounted in one arm of an interferometer. One single image of the fringe pattern is recorded, a simple image process is applied generating phase shifted patterns from the original image. Using the appropriate phase shift algorithms, a phase map of the sample is obtained which gives a quantitative measurement of the topographical structure with the resolution of the phase shift method but a single shot recorded pattern.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 43, Issue 12, December 2005, Pages 1305-1314
Journal: Optics and Lasers in Engineering - Volume 43, Issue 12, December 2005, Pages 1305-1314
نویسندگان
M. de Angelis, S. De Nicola, P. Ferraro, A. Finizio, S. Grilli, G. Pierattini,