کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10410758 | 894498 | 2005 | 15 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Development nano-Moiré method with high-resolution microscopy at FML
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Some novel nano-Moiré methods have been developed at failure mechanics lab in the Tsinghua University, recently. This paper offers an introduction of these new methods, which can be realized under the atomic force microscope, scanning tunneling microscope, as well as the transmission electron microscope. These nano-Moiré methods are able to offer quantitative analysis to nano-deformation of object. The measurement principles and experimental techniques of these methods are described in detail. A new digital nano-Moiré technique is proposed. Some typical applications to these methods are discussed. The successful experimental results demonstrate the feasibility of these methods and also verify that the methods can offer a high sensitivity for displacement measurement with nano-meter spatial resolution.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics and Lasers in Engineering - Volume 43, Issue 8, August 2005, Pages 904-918
Journal: Optics and Lasers in Engineering - Volume 43, Issue 8, August 2005, Pages 904-918
نویسندگان
Huimin Xie, Zhanwei Liu, Daining Fang, Fulong Dai, Haixia Shang,