کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10412877 | 895271 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigation of microstructure and piezoelectric properties of Zr- and Sm-doped PbTiO3 nanostructured thin films derived by sol-gel technology
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی آنالیزی یا شیمی تجزیه
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Pb1.0175Sm0.05(Zr0.52Ti0.48)O3 (PSZT), PbSm0.05TiO3 (PST), Pb(Zr0.52Ti0.48)O3 (PZT) and heterostructure PST/PSZT thin films were deposited by sol-gel technique and investigated with emphasis on suitability for specific applications. Macroscopic piezoelectric properties are investigated by laser Doppler vibrometry, and surface microstructure and local piezoelectric properties by piezoresponse atomic force microscopy. Sm-doped films have smooth microstructure with grain 60-90Â nm and piezoelectric coefficient d33 7-62Â pm/V. Poling induced large polarization imprint in these films. PZT film exhibits high d33 (93Â pm/V in unpoled and 419Â pm/V in poled state), but is susceptible to aging in unpoled state. Local piezoelectric hysteresis loop is obtained, and polarization patterning is demonstrated for PZT film.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Sensors and Actuators B: Chemical - Volume 109, Issue 1, 24 August 2005, Pages 97-101
Journal: Sensors and Actuators B: Chemical - Volume 109, Issue 1, 24 August 2005, Pages 97-101
نویسندگان
Arturas Ulcinas, Mohammed Es-Souni, Valentinas Snitka,