کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10421339 | 905804 | 2005 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Ultrasonic characterization of point defects induced by cross slip under pure shear
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی مکانیک
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Longitudinal wave velocity is used to characterize the point defects in crystalline solids. High purity Al single crystal was selected for both the finite element analysis and experimental work. Since the jog motions of dislocations caused by intersected slides such as cross slips induce point defects, the total amount of cross slips was calculated instead of calculating directly from the point defects. The effect of crystal orientations on total amount of cross slips under pure shear was also investigated via the finite element method. The result suggest that if the initial shear stress direction is located at the inner side of stereographic triangle, only single slip activities occurred at the beginning of plastic deformation and no effects due to point defects were present. However, as the shear stress direction rotates along the slip direction, point defects are induced by cross slips between primary and secondary slip systems due to work-hardening. This phenomenon was then examined by measuring longitudinal wave velocity changes propagating in Al single crystal subjected to the combination loads of equi-biaxial tension and compression (a pure shear state). Good qualitative agreement between the finite element result and measured data suggest that the longitudinal wave velocity can be used as an index to characterize point defects in crystalline materials.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Theoretical and Applied Fracture Mechanics - Volume 43, Issue 2, May 2005, Pages 169-180
Journal: Theoretical and Applied Fracture Mechanics - Volume 43, Issue 2, May 2005, Pages 169-180
نویسندگان
S.-H. Tang, M. Kobayashi, H.-L. Pan,