Effect of Ta buffer and NiFe seed layers on pulsed-DC magnetron sputtered Ir20Mn80/Co90Fe10 exchange bias

► We discussed the influence of Ta/NiFe thicknesses on structure and grain size in AF layer and texture. ► A direct correlation between the 〈1 1 1〉 texture and exchange coupling was found. ► A direct relation between average grain size and Hex and Hc was not observed. L12 phase IrMn3 was formed by deposition at room temperature for Ta (5-6 nm)/NiFe (6-8 nm). ► We conclude that the coercivity is influenced by order/disorder at NiFe/IrMn/CoFe interfaces.