کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
11021070 | 1715043 | 2018 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Gamma rays' shielding parameters for some Pb-Cu binary alloys
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کلمات کلیدی
GEVCs137ΔZZeffHVTMFPTVTEBFRPEμMMEVFCCNaI(Tl) - NaI (Tl)Binary alloys - آلیاژهای دودوییEffective atomic number - شماره اتمی موثرEffective electron number - شماره الکترون موثرGamma ray spectroscopy - طیف سنجی اشعه گاماExposure buildup factor - فاکتور رشد در معرض خطرface centred cubic - مکعب چهره محورkeV - کیلووات
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
علوم کامپیوتر (عمومی)
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Binary alloys of xPb-(1-x)Cu where x varies from 0.1 to 0.9 with the increment of 0.1 were prepared. The physical properties and gamma rays' shielding parameters in terms of density (Ï), attenuation coefficient (μm), mean free path (mfp), half value thickness (HVT), tenth value thickness (TVT), effective atomic number (Zeff), effective electron number (Ne), radiation protection efficiency (RPE) and exposure buildup factor (EBF) were studied for the prepared alloys. Using narrow beam geometry, transmitted photon spectra were recorded with the help of GAMMARAD5 (scintillator detector of NaI(Tl) crystal dimensions 3â³â¯Ãâ¯3â³ having resolution of 6.5% at 662â¯keV) and radioactive isotopes of Na22 (511â¯keV), Cs137 (662â¯keV) and Mn54 (835â¯keV). These recorded spectra were analysed to compute μm values; which were further used to compute mfp, HVT, TVT, Zeff, Ne (in energy region 1â¯keV-100â¯GeV) and EBF (in energy region 15â¯keV-15â¯MeV). Good agreement has been observed between the experimentally measured and theoretically generated results. The shielding parameters for the alloy samples were analysed on the basis of chemical composition, energy and penetration thickness.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Engineering Science and Technology, an International Journal - Volume 21, Issue 5, October 2018, Pages 1078-1085
Journal: Engineering Science and Technology, an International Journal - Volume 21, Issue 5, October 2018, Pages 1078-1085
نویسندگان
Tejbir Singh, Amandeep Kaur, Jeewan Sharma, Parjit S. Singh,