Wide-band mass measurements with a multi-reflection time-of-flight mass spectrograph

• Method for analyzing wide-band spectra produced with a multi-reflection time-of-flight mass spectrograph is developed.
• The method is verified with a set of spectra produced from a thermal ion source.
• Non-isobaric ions can be uniquely identified.
• With an isobaric reference ion, a relative precision of 2.6 × 10−7 is demonstrated.

We characterize the mass bandwidth of the multi-reflection time-of-flight mass spectrograph, showing both the theoretical and effective mass bandwidth. We then demonstrate the use of a multi-reflection time-of-flight mass spectrograph to perform mass measurements in mass bands much wider than the mass bandwidth.

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