Static-mirror ion capture and time focusing for electrostatic ion-beam traps and multi-reflection time-of-flight mass analyzers by use of an in-trap potential lift

Capture and ejection of ions in electrostatic ion-beam traps and multi-reflection time-of-flight (MR-ToF) devices can be accomplished by pulsing the potential of only a single drift tube inside of the device in contrast to the conventional switching of the ion-mirror voltages. In addition to its simplicity, the new method allows to set the position of the time-focus plane at a given ion detector or ion-beam separator without the need of any further hardware. The position can be adjusted easily by the choice of the pulse height of the potential switch.

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► Ion injection and ejection can be accomplished without switching the mirror electrode potentials in electrostatic ion-beam traps and MR-ToF-MS.
► Ion-optical decoupling of the adjacent beam line ion optics from the storage device.
► Simplified optimization for high mass-resolving power.