A Method to Separate Bulk Lifetime and Surface Recombination Velocity of Silicon Bricks based on Transient Photoluminescence

We present a method to separate bulk lifetime and surface recombination velocity using transient photoluminescence (PL). With the use of the analytical expression of transient PL, the asymptotic separation of two transient PL decays excited by different wavelengths can be obtained. Combined with the use of the intensity ratio of two steady-state PL intensities excited by the two different wavelengths, the lifetime separation can be achieved. In addition, detailed methods to experimentally determine the two terms are presented.