Line-Imaging Spectroscopy for Characterisation of Silicon Wafer Solar Cells

Line-imaging spectroscopy can be applied to enable the extraction of the luminescence spectrum at each point on a solar cell. The resulting hyperspectral image of luminescence may characterise the photovoltaic material or device. In this paper, a line-imaging instrument which can perform spatially resolved luminescence spectroscopy on silicon wafer solar cells is investigated. The instrument is applied to analyse a textured and an untextured multicrystalline silicon wafer solar cell. Detectable differences in the luminescence spectrum are observed.