An Information Model for Surface Metrology

According to ISO standards, the specification and verification of surface texture includes an ordered set of operations. In order to reduce the specification uncertainty, it is of importance to model the significant information related to surface measurement. This paper documents the development of a XML-based information model for surface metrology. Traditional paper-based documents with unstructured data are intergraded into one structured data for surface metrology. Therefore, it limits the specification uncertainty and enhances the reproducibility of surface measurement.