کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1712893 | 1519807 | 2008 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Bayesian synthetic evaluation of multistage reliability growth with instant and delayed fix modes
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In the multistage reliability growth tests with instant and delayed fix modes, the failure data can be assumed to follow Weibull processes with different parameters at different stages. For the Weibull process within a stage, by the proper selection of prior distribution form and the parameters, a concise posterior distribution form is obtained, thus simplifying the Bayesian analysis. In the multistage tests, the improvement factor is used to convert the posterior of one stage to the prior of the subsequent stage. The conversion criterion is carefully analyzed to determine the distribution parameters of the subsequent stage's variable reasonably. Based on the mentioned results, a new synthetic Bayesian evaluation program and algorithm framework is put forward to evaluate the multistage reliability growth tests with instant and delayed fix modes. The example shows the effectiveness and flexibility of this method.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Systems Engineering and Electronics - Volume 19, Issue 6, December 2008, Pages 1287-1294
Journal: Journal of Systems Engineering and Electronics - Volume 19, Issue 6, December 2008, Pages 1287-1294
نویسندگان
Yan Zhiqiang, Li Xinxin, Xie Hongwei, Jiang Yingjie,